Picosecond dynamic response of nanoscale low-temperature grown GaAs metal-semiconductor-metal photodetectors

Applied Physics Letters

Volumn 68, Issue 14, 1996, Pages 1972-1974

  Joshi, R P ^a   McAdoo, J A ^b  

^a Old Dominion University   (United States)

^b NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; DYNAMIC RESPONSE; ELECTRIC CURRENTS; ELECTRIC FIELDS; FABRICATION; IMPURITIES; MONTE CARLO METHODS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; ULTRAFAST PHENOMENA;

AIRY WAVE FUNCTIONS; FULL WIDTH AT HALF MAXIMUM; INTERVALLEY DEFORMATION POTENTIAL; LASER EXCITATIONS; METAL SEMICONDUCTOR METAL PHOTODETECTORS; PHOTOMIXERS; POLAR OPTICAL TRANSITIONS;

PHOTODETECTORS;

EID: 0030127817     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115643     Document Type: Article

References (16)

1. M. Ito and O. Wada, IEEE J. Quantum Electron. QE-22, 1073 (1986).
2. J. H. Burroughes, D. L. Rogers, G. Arjavalingam, G. Pettit, and M. S. Goorsky, IEEE Photonics Technol. Lett. 3, 657 (1991).
3. S. Y. Chou and M. Y. Liu, IEEE J. Quantum Electron. 28, 2358 (1992).
4. S. Y. Chou, Y. Liu, W. Khalil, T. Y. Hsiang, and S. Alexandrou, Appl. Phys. Lett. 61, 819 (1992); S. Y. Chou, Y. Liu, and P. B. Fischer, Appl. Phys. Lett. 61, 477 (1992).
5. Y. Chen, S. Williamson, T. Brock, F. W. Smith, and A. R. Calawa, Appl. Phys. Lett. 59, 1984 (1991).
6. E. R. Brown, F. W. Smith, and K. A. McIntosh, J. Appl. Phys. 73, 1480 (1993).
7. M. Klingenstein, J. Kuhl, J. Rosenzweig, C. Moglestue, and A. Axmann, Appl. Phys. Lett. 58, 2503 (1991); M. Lambsdorff, M. Klingstein, J. Kuhl, C. Moglestue, J. Rosenzweig, A. Axmann, J. Schneider, A. Hulsmann, H. Leier, and A. Forchel, Appl. Phys. Lett. 58, 1410 (1991).
8. W. C. Koscielniak, J. L. Pelouard, and M. A. Littlejohn, IEEE Photon. Technol. Lett. 2, 125 (1990); W. C. Koscielniak, J. L. Pelouard, and M. A. Littlejohn, Appl. Phys. Lett. 54, 567 (1989).
9. J. B. D. Soole and H. Schumacher, IEEE Trans. Electron. Devices ED-37, 2285 (1990).
10. K. Nabors, S. Kim, J. White, and S. Senturia, in FastCap USER'S Guide, (MIT, Cambridge, MA, 1992).
11. R. P. Joshi, K. T. Tsen, and D. K. Ferry, Phys. Rev. B 41, 9899 (1990); R. P. Joshi and R. O. Grondin, J. Appl. Phys. 66, 4288 (1989).
12. S. Chamoun, R. P. Joshi, E. Arnold, R. O. Grondin, K. Meyer, M. Pessot, and G. A. Mourou, J. Appl. Phys. 66, 236 (1989).
13. S. Adachi, J. Appl. Phys. 58, R1 (1985).
14. F. Stern and S. Das Sarma, Phys. Rev. B 30, 840 (1984).
15. M. Y. Frankel, B. Tadayon, and T. F. Carruthers, Appl. Phys. Lett. 62, 255 (1993).
16. B. J. van Zeghbroeck, W. Patrick, J. M. Halbout, and P. Vettiger, IEEE Electron. Device Lett. EDL-9, 527 (1988).