Current conduction in quantum well infrared photodetectors under low bias operation

Applied Physics Letters

Volumn 68, Issue 18, 1996, Pages 2532-2534

  Wang, Daniel C ^a   Bosman, Gijs ^a   Li, Sheng S ^a  

^a University of Florida   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELDS; ELECTRIC RESISTANCE; ELECTRIC VARIABLES MEASUREMENT; LOW TEMPERATURE OPERATIONS; MATHEMATICAL MODELS; NYQUIST DIAGRAMS; SEMICONDUCTOR QUANTUM WELLS; STATISTICAL METHODS;

DARK CURRENTS; QUANTUM WELL INFRARED PHOTODETECTORS; SPECTRAL DENSITY; THERMALIZATION;

INFRARED DETECTORS;

EID: 0030127498     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116174     Document Type: Article

References (4)

1. D. C. Wang, G. Bosman, and S. S. Li, J. Appl. Phys. (in press).
2. A. van der Ziel, Noise in Solid State Devices and Circuits (Wiley-Interscience, New York, 1986).
3. S. M. Sze, Physics of Semiconductor Devices, 2nd ed. (Wiley-Interscience, New York, 1981).
4. D. C. Wang, G. Bosman, Y. H. Wang, and S. S. Li, J. Appl. Phys. AIP 77, 1107 (1995).