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Journal of Materials Science: Materials in Electronics

Volumn 7, Issue 2, 1996, Pages 101-106

Mössbauer study of Fe magnetic state at the interface between Fe-AI-Si thin films and crystallized glass substrate

(5) Komatsu, T a Sakemi, Y a Shimagami, K a Matusita, K a Miyazaki, M b

a NAGAOKA UNIVERSITY OF TECHNOLOGY (Japan)

b TDK CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; FERROMAGNETIC MATERIALS; GLASS; INTERFACES (MATERIALS); IRON; IRON ALLOYS; MAGNETIC FIELDS; MAGNETIC FILMS; MAGNETIZATION; MOSSBAUER SPECTROSCOPY; SILICA; SPUTTERING;

CONVERSION ELECTRON MOSSBAUER SPECTROSCOPY; CRYSTALLIZED GLASS SUBSTRATE; SENDUST FILMS;

MAGNETIC PROPERTIES;

EID: 0030127286 PISSN: 09574522 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (8)

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