Effects of an external electric field from a substrate on conductance of SnO2 thin films

Journal of the Electrochemical Society

Volumn 143, Issue 4, 1996, Pages 1334-1338

  Kunishima, Yoshiko Niki ^a   Miyayama, Masaru ^a   Yanagida, Hiroaki ^b  

^a UNIVERSITY OF TOKYO   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; ELECTRIC RESISTANCE MEASUREMENT; OXYGEN; SEMICONDUCTING SILICON; SEMICONDUCTING TIN COMPOUNDS; SILICA; SPUTTERING; SUBSTRATES; SURFACES;

ELECTRON TRAPS; EXTERNAL ELECTRIC FIELD; METAL OXIDE SEMICONDUCTOR THEORY; SURFACE OXYGEN ADSORBATES; TIN DIOXIDE;

THIN FILMS;

EID: 0030126881     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1836639     Document Type: Article

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