Si-TaSi2 in situ composites: A new monochromator material for hard X-rays

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 372, Issue 3, 1996, Pages 551-555

  Neumann, H B ^a   Schneider, J R ^a   Sußenbach J ^a   Stock, S R ^b   Rek, Z U ^c  

^a DESY   (Germany)

^b Georgia Institute of Technology   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTAL GROWTH; CRYSTAL ORIENTATION; DEFORMATION; DIFFRACTOMETERS; MONOCHROMATORS; OPTICAL RESOLVING POWER; PHOTONS; SEMICONDUCTING SILICON; SYNCHROTRON RADIATION; TANTALUM ALLOYS; X RAY CRYSTALLOGRAPHY;

HARD X RAYS; MONOCHROMATOR MATERIALS; TRIPLE AXIS DIFFRACTOMETRY;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0030126505     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(95)01448-9     Document Type: Article

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