XPS and SERS studies of cell adhesion-controlled polymer modified by ion implantation

Surface and Interface Analysis

Volumn 24, Issue 4, 1996, Pages 252-256

  Nakao, A ^a   Kaibara, M ^a   Iwaki, M ^a   Suzuki, Y ^b   Kusakabe, M ^b  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; CELLS; CHEMICAL BONDS; ION BOMBARDMENT; ION IMPLANTATION; NEON; PLASMA APPLICATIONS; POLYSTYRENES; RAMAN SPECTROSCOPY; SPECTROMETERS; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

FUNCTIONAL GROUP; HELA CELL ADHESION CONTROL; ION BOMBARDED POLYMER; OXYGEN PLASMA TREATED POLYSTYRENE; SURFACE ENHANCED RAMAN SPECTROSCOPY;

POLYMERS;

EID: 0030126183     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199604)24:4<252::AID-SIA113>3.0.CO;2-R     Document Type: Article

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