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Volumn 32, Issue 8, 1996, Pages 766-767
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Very low dark current InGaP/GaAs MSM-photodetector using semi-transparent and opaque contacts
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Author keywords
Metal semiconductor metal structures; Photodetectors
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Indexed keywords
BANDWIDTH;
CONTINUOUS WAVE LASERS;
CURRENT DENSITY;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC BREAKDOWN;
ELECTRIC CURRENTS;
ELECTRIC NETWORK ANALYZERS;
MOLECULAR BEAM EPITAXY;
PHOTOLITHOGRAPHY;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR DEVICE MANUFACTURE;
ELECTRON BEAM EVAPORATION;
GAS SOURCE MOLECULAR BEAM EPITAXY;
OPAQUE CONTACT;
SEMI TRANSPARENT CONTACT;
SEMICONDUCTOR PARAMETER ANALYZER;
PHOTODETECTORS;
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EID: 0030125752
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19960473 Document Type: Article |
Times cited : (14)
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References (6)
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