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Volumn 111, Issue 1-2, 1996, Pages 63-69

Erosion behaviour and surface composition modifications of SiC under D+ ion bombardment

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; COMPOSITION; DEUTERIUM; EROSION; INFILTRATION; ION BOMBARDMENT; SILICON CARBIDE; SPUTTERING; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0030125480     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01258-3     Document Type: Article
Times cited : (16)

References (20)
  • 4
    • 30244468792 scopus 로고    scopus 로고
    • private communication; General Atomics, General Atomics Court, PO Box 85608, San Diego, CA 92186-9784
    • H. Streckert, private communication; General Atomics, General Atomics Court, PO Box 85608, San Diego, CA 92186-9784.
    • Streckert, H.1
  • 14
    • 30244568726 scopus 로고    scopus 로고
    • unpublished results
    • W. Eckstein, unpublished results.
    • Eckstein, W.1
  • 16
    • 0003828439 scopus 로고
    • eds. J. Briggs and M.P. Seah Wiley, Chichester, New York, Brisbane, Toronto, Singapore, 1990; Salle + Sauerländer, Aarau, Frankfurt am Main, Salzburg
    • M.P. Seah, in: Practical Surface Analysis, 2nd Ed., Vol. 1, eds. J. Briggs and M.P. Seah (Wiley, Chichester, New York, Brisbane, Toronto, Singapore, 1990; Salle + Sauerländer, Aarau, Frankfurt am Main, Salzburg, 1990) p. 210.
    • (1990) Practical Surface Analysis, 2nd Ed. , vol.1 , pp. 210
    • Seah, M.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.