Perpendicular magnetic anisotropy in epitaxial Cu/Ni/Cu/Si (001)

Thin Solid Films

Volumn 275, Issue 1-2, 1996, Pages 155-158

  Inglefield, H E ^a   Bochi, G ^a   Ballentine, C A ^a   O'Handley, R C ^a   Thompson, C V ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Epitaxy; Magnetic properties and measurements; Nickel; Stress

Indexed keywords

COPPER; EPITAXIAL GROWTH; KERR MAGNETOOPTICAL EFFECT; MAGNETIC ANISOTROPY; MAGNETIC PROPERTIES; MAGNETIC VARIABLES MEASUREMENT; MATHEMATICAL MODELS; NICKEL; SILICON; SINGLE CRYSTALS; STRESSES; SUBSTRATES;

ELECTRON BEAM EVAPORATION; NEEL PAIR INTERACTION MODEL; PERKIN-ELMER MOLECULAR BEAM EPITAXY CHAMBER; SUBSTRATE CURVATURE MEASUREMENTS; VIBRATING SAMPLE MAGNETOMETRY;

THIN FILMS;

EID: 0030125369     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07031-1     Document Type: Article

References (6)

1. G. Bochi, C.A. Ballentine, H.E. Inglefield, S.S. Bogomolov, C.V. Thompson and R.C. O'Handley, Mater. Res. Soc. Symp. Proc., 313 (1993) 309.
2. H.B. Inglefield, C.A. Ballentine, G. Bochi, S.S. Bogomolov, R.C. O'Handley and C.V. Thompson, Mater. Res. Soc. Symp. Proc., 308 (1993) 765.
3. H.E. Inglefield, G. Bochi, C.A. Ballentine, R.C. O'Handley and C.V. Thompson, Mater. Res. Soc. Symp. Proc., 356 (1995).
4. G. Bochi, C.A. Ballentine, H.E. Inglefield, C.V. Thompson and R.C. O'Handley, Phys. Rev. B, 53 (1996) R1729.
5. H.E. Inglefield, Ph.D. Thesis, Dept. of Materials Science and Engineering, Massachusetts Institute of Technology, June 1995.
6. D.S. Chuang, C.A. Ballentine and R.C. O'Handley, Phys. Rev., B 49 (1994) 15084.