Characterization by diffuse X-ray scattering of damage in ion-implanted HgCdTe

Journal of Crystal Growth

Volumn 161, Issue 1-4, 1996, Pages 139-143

  Declemy A ^a   Renault, P O ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPACTION; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); ELECTROMAGNETIC WAVE SCATTERING; ION IMPLANTATION; IONS; LOW TEMPERATURE EFFECTS; MERCURY COMPOUNDS; SEMICONDUCTOR MATERIALS; X RAYS;

BRAGG PEAKS; DIFFUSES X RAY SCATTERING; INTERSTITIAL DISLOCATION LOOPS; MERCURY CADMIUM TELLURIUM; NUCLEAR ENERGY LOSS;

POINT DEFECTS;

EID: 0030125313     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(95)00623-0     Document Type: Article

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