A guiding principle to select PIXE or PIXE-induced XRF for steel analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 109-110, Issue , 1996, Pages 569-572

  Morito, K ^a   Nagashima, S ^a   Kato, M ^a   Kotani, T ^a   Uda, M ^a  

^a WASEDA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DATA ACQUISITION; IMPURITIES; PARTICLE ACCELERATORS; SIGNAL TO NOISE RATIO; TRACE ANALYSIS; TRACE ELEMENTS; X RAY ANALYSIS;

MINIMUM DETECTION LIMIT; PARTICLE INDUCED X RAY EMISSION (PIXE); X RAY FLUORESCENCE (XRF);

STEEL;

EID: 0030125062     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00970-1     Document Type: Article

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