SNR improvement in silica-based waveguide Rayleigh backscattering measurement using a complex optical low coherence reflectometer

Electronics Letters

Volumn 32, Issue 9, 1996, Pages 843-845

  Takada, K ^a   Yamada, H ^a  

^a NTT CORPORATION   (Japan)

Author keywords

Optical waveguides; Reflectometers

Indexed keywords

BACKSCATTERING; RAYLEIGH SCATTERING; REFLECTOMETERS; SIGNAL TO NOISE RATIO; SILICA;

COMPLEX OPTICAL LOW COHERENCE REFLECTOMETER; SILICA BASED WAVEGUIDES;

OPTICAL WAVEGUIDES;

EID: 0030124621     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19960572     Document Type: Article

References (3)

1. TAKADA, K., YAMADA, H., and HORIGUCHI, M.: 'Loss distribution measurement of silica-based waveguides by using a jaggedness-free optical low coherence reflectometer', Electron. Lett., 1994, 30, pp. 1441-1442
2. BRINKMEYER, E., and GLOMBITZA, U.: 'Complex coherence-domain reflectometry in active laser diodes', Opt. Lett., 1992, 17, pp. 1441-1443
3. TAKADA, K., YAMADA, H., and HORIGUCHI, M.: 'Optical low coherence reflectometer using [3x3] fibre coupler', Photonics. Technol. Lett., 1994, 6, pp. 1014-1016