Atomic thermal vibrations in semiconductors: Ab initio calculations and EXAFS measurements

Physica B: Condensed Matter

Volumn 219-220, Issue 1-4, 1996, Pages 436-438

  Strauch, D ^a   Pavone, P ^a   Nerb, N ^a   Karch, K ^b   Windl, W ^a   Dalba, G ^c   Fornasini, P ^c  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

^c Universita   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CORRELATION METHODS; CRYSTAL ATOMIC STRUCTURE; PHONONS; SEMICONDUCTOR MATERIALS; X RAY ANALYSIS;

ATOMIC THERMAL VIBRATIONS; DEBYE WALLER FACTORS; EXTENDED X RAY ABSORPTION FINE STRUCTURES (EXAFS); HARMONIC APPROXIMATION; NONSTANDARD CUMULANT ANALYSIS;

LATTICE VIBRATIONS;

EID: 0030124255     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00770-9     Document Type: Article

References (4)

1. For a review see E.D. Crozier, J.J. Rehr and R. Ingalls, in: X-Ray Absorption: Principles, Applications and Techniques, eds. D.C. Kroningsberger and R. Prins (Wiley, New York, 1991) p. 373.
2. G. Dalba, D. Diop, P. Fornasini and F. Rocca, J. Phys.: Condens. Matter 6 (1994) 3599.
3. P. Giannozzi, S. de Gironcoli, P. Pavone and S. Baroni, Phys. Rev. 43 (1991) 7231.
4. D. Strauch and B. Dorner, J. Phys.: Condens. Matter 2 (1990) 1457.