Relationship between deep levels in vanadium-doped CdTe and photorefractive effect

Journal of Crystal Growth

Volumn 161, Issue 1-4, 1996, Pages 264-270

  Zerrai, A ^a   Marrakchi, G ^a   Bremond, G ^a   Moisan, J Y ^b   Martel, G ^b   Gauneau, M ^b   Lambert, B ^b   Gravey, P ^b   Wolffer, N ^b   Aoudia, A ^a   Marfaing, Y ^a   Triboulet, R ^a   Koebel, J M ^c   Hadj Ali, M ^c   Siffert, P ^c  

^a CNRS   (France)

^b ORANGE LABS   (France)

^c Faculté de Médecine   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CRYSTALS; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON ENERGY LEVELS; ELECTRON RESONANCE; ELECTRONIC PROPERTIES; ELECTRONS; OPTICAL PROPERTIES; VANADIUM;

CADMIUM TELLURIDE; DEEP LEVEL OPTICAL SPECTROSCOPY; ELECTRON TRAPS; PHOTOINDUCED CURRENT TRANSIENT SPECTROSCOPY; PHOTOREFRACTIVE EFFECTS; VERTICAL BRIDGMAN METHOD;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0030123797     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0248(95)00668-0     Document Type: Article

References (8)

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6. J.Y. Moisan, P. Gravey, G. Martel, N. Wolffer, A. Aoudia, Y. Marfaing, R. Triboulet, M.C. Busch, M. Hadj-Ali, J.M. Koebel and P. Siffert, Opt. Mater, 4 (1995) 219.
7. E. Rzepka, A. Aoudia, M. Cuniot, A. Lusson, Y. Marfaing, R. Triboulet, G. Bremond, G. Marrakchi, K. Cherkaoui, M.C. Busch, J.M. Koebel, M. Hadj-Ali, P. Siffert, J.Y. Moisan, P. Gravey, N. Wolffer and O. Moine, J. Crystal Growth 138 (1994) 244.
8. G. Martel, J.Y. Moisan, B. Lambert, M. Gauneau, N. Wolffer, P. Gravey, A. Aoudia, Y. Marfaing, R. Triboulet, M.C. Busch, M. Hadj-Ali, J.M. Koebel, P. Siffert, G. Bremond, A. Zerrai and G. Marrakchi, J. Crystal Growth 161 (1996) 250.