Substrate engineering with plastic buffer layers

MRS Bulletin

Volumn 21, Issue 4, 1996, Pages 45-49

  Schowalter, Leo J ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); ELECTRIC PROPERTIES; FLUORINE COMPOUNDS; INTERFACES (MATERIALS); LATTICE CONSTANTS; MECHANICAL PROPERTIES; NUCLEATION; PLASTIC DEFORMATION; SEMICONDUCTING FILMS; SUBSTRATES; THERMODYNAMIC PROPERTIES; THICKNESS MEASUREMENT;

COMPLIANT SUBSTRATE APPROACH; EPITAXIAL BUFFER LAYER; FLUORIDE FILMS; HETEROEPITAXY; LATTICE MISMATCH; PLASTIC BUFFER LAYER; TEMPLATE LAYER;

EPITAXIAL GROWTH;

EID: 0030123724     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400035338     Document Type: Article

References (25)

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