Tapping-mode scanning force microscopy: Metallic tips and samples

Computational Materials Science

Volumn 5, Issue 4, 1996, Pages 291-297

  Sarid, Dror ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; OSCILLATORS (ELECTRONIC);

BIAS VOLTAGE; DRIVEN NONLINEAR OSCILLATOR; TAPPING MODE SCANNING FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY;

EID: 0030123676     PISSN: 09270256     EISSN: None     Source Type: Journal    
DOI: 10.1016/0927-0256(96)00003-1     Document Type: Article

References (28)

1. G. Binnig, C.F. Quate and Ch. Gerber, Phys. Rev. Lett. 56 (1986) 930.
2. G. Binnig, Ultramicroscopy 42-44 (1992) 7.
3. D. Rugar and P.K. Hansma, Phys. Today 43 (1990) 23.
4. D. Sarid, Scanning Force Microscopy (Oxford Univ. Press, New York, 1991, rev. Ed. 1994).
5. Digital Instruments, Inc., 520 E. Montecito Street, Santa Barbara, CA 93103.
6. Q. Zhong, D. Inniss, K. Kjoller and V.B. Elings, Surf. Sci. Lett. 290 (1993) L688.
7. C.A.J. Putman, K.O. Van der Werf, B.G. De Grooth, N.K. van Hulst and J. Greve, Appl. Phys. Lett. 64 (1994) 2454.
8. H.G. Hansma and J.H. Hoh, Annu. Rev. Biophys. Biomol. Struct. 23 (1994) 115.
9. P.K. Hansma, J.P. Cleveland, M. Radmacher, D.A. Walters, P.E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H.G. Hansma, C.B. Prater, J. Massie, L. Fukunaga, J. Gurley and V. Elings, Appl. Phys. Lett. 64 (1994) 1738.
10. R. Höper, R.K. Workman, D. Chen, D. Sarid, T. Yadav, J.C. Withers and R.O. Loutfy, Surf. Sci. Lett. 311 (1994) L731.
11. D. Sarid, J. Chen and R.K. Workman, Comput. Mater. Sci. 3 (1995) 475.
12. R. Giles, S. Manne, C.M. Zaremba, A. Belcher, S. Mann, D.E. Morse, G.D. Stucky and P.K. Hansma, MRS Proc. 332 (1994) 413.
13. S.H. Strogatz, Nonlinear Dynamics and Chaos (Addison-Wesley, New York, 1994).
14. U. Landman, W.D. Luedtke, N.A. Burnham and R.J. Colton, Science 248 (1990) 454.
15. U. Landman and W.D. Luedtke, Scanning Tunneling Microscopy III (Springer, Berlin, 1993) p. 207.
16. C.C. Williams and H.K. Wickramasinghe, J. Vac. Sci. Technol. B 9 (1991) 537.
17. J.H. Rose, J.R. Smith and J. Ferrante, Phys. Rev. B 28 (1983) 1835.
18. J.R. Smith and A. Banerjea, Phys. Rev. Lett. 59 (1987) 2451.
19. J. Ferrante and J.R. Smith, Phys. Rev B 31 (1985) 3427.
20. A. Banerjea, J. Ferrante and J.R. Smith, Fundamentals of Adhesion (Plenum, New York, 1991) p. 325.
21. S. Ciraci, Scanning Tunneling Microscopy III (Springer, Berlin, 1993) p. 179.
22. C.J. Chen, Introduction to Scanning Tunneling Microscopy (Oxford Univ. Press, New York, 1993).
23. N.D. Lang, Phys. Rev. B 36 (1987) 8173.
24. D.P.E. Smith, G. Binnig and C.F. Quate, Appl. Phys. Lett. 49 (1986) 1166.
25. J.K. Gimzewski, R. Möller, D.W. Pohl and R.R. Schlittler, Surf. Sci. 189/190 (1987) 15.
26. J.K. Gimzewski and R. Möller, Phys. Rev. B 36 (1987) 1284.
27. U. Dürig, O. Züger and D.W. Pohl, J. Microscopy 152 (1988) 259.
28. U. Dürig, O. Züger and D.W. Pohl, Phys. Rev. Lett. 65 (1990) 349.