Effects of stress on step energies and surface roughness

MRS Bulletin

Volumn 21, Issue 4, 1996, Pages 27-30

  Roland, Christopher ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); EPITAXIAL GROWTH; FILM GROWTH; GERMANIUM ALLOYS; INTERFACIAL ENERGY; MOLECULAR DYNAMICS; STRAIN; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY;

COMPRESSIVE STRAIN; STEP FREE ENERGY; STRAIN RELAXATION; STRAIN RELIEF; STRAINED LENNARD-JONES CRYSTAL; STRESS EFFECTS; SURFACE RECONSTRUCTION;

STRESS RELAXATION;

EID: 0030123671     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/S0883769400035302     Document Type: Article

References (31)

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