Influence of interface roughness and quantum size effect on the giant magnetoresistance in magnetic layered structures

Thin Solid Films

Volumn 275, Issue 1-2, 1996, Pages 148-151

  Barnas J ^a,b   Bruynseraede, Y ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b ADAM MICKIEWICZ UNIVERSITY   (Poland)

Author keywords

Interfaces; Magnetic properties; Quantum effects

Indexed keywords

CORRELATION METHODS; ELECTRON TRANSPORT PROPERTIES; ELECTRONS; FERROMAGNETIC MATERIALS; INTERFACES (MATERIALS); MAGNETIC PROPERTIES; MAGNETORESISTANCE; MATHEMATICAL MODELS; QUANTUM THEORY; STATISTICAL METHODS; SURFACE ROUGHNESS;

FERROMAGNETIC FILMS; FREE ELECTRON LIKE ONE BAND MODEL; GIANT MAGNETORESISTANCE; INTERFACE ROUGHNESS; MAGNETIC LAYERED STRUCTURES; QUANTUM SIZE EFFECT; QUASI CLASSICAL LIMIT; SPIN MAJORITY ELECTRONS; SPIN MINORITY ELECTRONS; SPIN VALVE MAGNETORESISTANCE;

ULTRATHIN FILMS;

EID: 0030123356     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07029-X     Document Type: Article

References (6)

1. For a review see S.S.P. Parkin, in B. Heinrich and J.A.C. Bland (eds.), Ultrathin Magnetic Structures II, Springer Verlag, Berlin, 1994, p. 148.
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