Residual stresses influence on the structural evolution of Cu-Mo solid solutions studied by X-ray diffraction

Thin Solid Films

Volumn 275, Issue 1-2, 1996, Pages 25-28

  Goudeau, Ph ^a   Mimault, J ^a   Girardeau, Th ^a   Reklaoui, K ^a   Proux, O ^a   Branger, V ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

Copper; Molybdenum; Stress; Structural properties; X ray diffraction

Indexed keywords

ANNEALING; COPPER ALLOYS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ION BEAMS; MOLYBDENUM ALLOYS; QUARTZ; RESIDUAL STRESSES; SOLID SOLUTIONS; SPUTTER DEPOSITION; SUBSTRATES; X RAY CRYSTALLOGRAPHY;

ATOMIC PEENING EFFECT; COHERENTLY DIFFRACTING DOMAINS; ENERGY DISPERSIVE SPECTROMETRY; ION BEAM SPUTTERING; ISOCHRONAL THERMAL TREATMENTS;

THIN FILMS;

EID: 0030123323     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07012-5     Document Type: Article

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