Surface characterization of YBa2Cu3Ox(001) single-crystal substrates for homoepitaxial growth

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 35, Issue 4 A, 1996, Pages

  Zama, H ^a   Wang, F ^a   Koyama, S ^a   Shiohara, Y ^a   Morishita, T ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; OXIDE SUPERCONDUCTORS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SINGLE CRYSTALS; SURFACE MEASUREMENT; SURFACE TESTING; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-RESOLVED X RAY SPECTROSCOPY; HOMOEPITAXIAL GROWTH; X RAY TOPOGRAPHY;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0030123296     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.l421     Document Type: Article

References (8)