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Volumn 154, Issue 2, 1996, Pages 693-706

Influence of carrier diffusion on transient one-carrier injection current in an insulator with traps

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CHARGE CARRIERS; ELECTRIC CURRENTS; ELECTRIC SPACE CHARGE; NUMERICAL ANALYSIS;

EID: 0030123210     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.2211540222     Document Type: Article
Times cited : (3)

References (44)
  • 5
    • 0003922680 scopus 로고
    • Pergamon Press, Oxford/New York/Toronto/Sydney/Paris/Frankfurt
    • K. C. KAO and W. HWANG, Electrical Transport in Solids, Pergamon Press, Oxford/New York/Toronto/Sydney/Paris/Frankfurt 1981.
    • (1981) Electrical Transport in Solids
    • Kao, K.C.1    Hwang, W.2
  • 34
  • 36
    • 0004005306 scopus 로고
    • John Wiley and Sons, New York/Chichester/Brisbane/Toronto/Singapure
    • S. M. SZE, Physics of Semiconductor Devices, John Wiley and Sons, New York/Chichester/Brisbane/Toronto/Singapure 1981,
    • (1981) Physics of Semiconductor Devices
    • Sze, S.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.