Measurement of L X-ray intensity ratios in tantalum by proton and Si-ion impact

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 111, Issue 1-2, 1996, Pages 22-26

  Braich, J S ^a   Goyal, D P ^a   Mandal, A ^b   Dhal, B B ^c   Singh, B P ^d   Padhi, H C ^c   Khuran, C S ^a   Verma, H R ^a  

^a PUNJABI UNIVERSITY   (India)

^b JAWAHARLAL NEHRU UNIVERSITY   (India)

^c INSTITUTE OF PHYSICS   (India)

^d All India Council for Technical Education   (India)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; ELECTRON ENERGY LEVELS; IONS; PROTONS; SILICON; TANTALUM; TARGETS; X RAYS;

ENERGY SHIFT; INTENSITY RATIOS; ION IMPACT; SHELL VACANCIES;

IONIZATION;

EID: 0030122525     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01299-0     Document Type: Article

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