Influence of the microstructure on the residual strains in (111) Au/Ni multilayers

Journal of Magnetism and Magnetic Materials

Volumn 156, Issue 1-3, 1996, Pages 31-32

  Thomas, O ^a   Labat, S ^a   Barallier, L ^a   Charai, A ^a   Alfonso, C ^a   Badawi, K ^a   Gilles, B ^a   Marty, A ^a  

^a MATOP   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; GOLD; MICROSTRUCTURE; MOLECULAR BEAM EPITAXY; NICKEL; RESIDUAL STRESSES; SPUTTERING; STRAIN MEASUREMENT; X RAY DIFFRACTION;

AVERAGE STRESS; RESIDUAL STRAINS; WAFER BENDING TECHNIQUE;

MULTILAYERS;

EID: 0030122510     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(95)00775-X     Document Type: Article

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