Optical and crystallographic properties of potassium-implanted tungsten

Thin Solid Films

Volumn 275, Issue 1-2, 1996, Pages 140-143

  Afif, M ^a   Girardeau Montaut, J P ^a   Perez, A ^a   Moncoffre, N ^a   Marest, G ^a   Fayeulle, S ^b   Frigerio, J M ^c  

^a UNIVERSITÉ LYON 1   (France)

^b ECOLE CENTRALE DE LYON   (France)

^c SORBONNE UNIVERSITÉ   (France)

Author keywords

Optical properties; Potassium; Tungsten; X ray diffraction

Indexed keywords

ELLIPSOMETRY; ION IMPLANTATION; LASER PULSES; OPTICAL PROPERTIES; PHOTOEMISSION; PHYSICAL PROPERTIES; POTASSIUM; RADIATION DAMAGE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TUNGSTEN; X RAY CRYSTALLOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL PROPERTIES; CRYSTALLOGRAPHIC PROPERTIES; DIELECTRIC FUNCTION; GRAZING INCIDENCE X RAY DIFFRACTION MEASUREMENT; PHOTOELECTRIC SENSITIVITY; TUNGSTEN HOST MATRIX;

THIN FILMS;

EID: 0030121694     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07027-3     Document Type: Article

References (7)

1. R.L. Sheffield, Report No. LA-UR-87-3036, FEL Conf., Los Alamos National Lab., Williamsburg, VA, 1987.
2. J.P. Girardeau-Montaut, C. Girardeau-Montaut, M. Afif, G. Haouat, C. Couillard, F. Sabary, And S. Joly, Euroconf. on Generation and Application of Ultrashort X-Ray pulses, Salamanca (S), 10-13 March, 1994.
3. J.P. Girardeau-Montaut, C. Girardeau-Montaut, M. Afif, A. Perez and S.D. Moustaïzis, Appl. Phys. Lett., 66 (1995) 1886.
4. G.S. Tompa, Cesium ion bombardment of metal surfaces, Ph.D. Thesis, Stevens Institute of Technology, Castle point Hoboken, NJ, May 1986.
5. V.S. Fomenko, in G.V. Samsonov (ed.), Handbook of Thermionic Properties, Plenum, New York, 1966, p. 53.
6. J.P. Girardeau-Montaut, C. Girardeau-Montaut and S.D. Moustaizis, Phys. D: Appl. Phys., 848. (1994) 27.
7. Jerry Donohue, The Structures of the Elements, Wiley-Interscience, New York.