In-situ study of the electrochemical deposition process of CdTe and HgxCd1-xTe using laser-scanning photoelectrochemical microscopy

Journal of Electroanalytical Chemistry

Volumn 405, Issue 1-2, 1996, Pages 233-237

  You, J K ^a   Yang, Y ^a   Chen, X G ^a   Gu, W D ^a   Zhuo, X D ^a   Lin, Z G ^a  

^a XIAMEN UNIVERSITY   (China)

Author keywords

CdTe; Electrodeposition; HgxCd1 xTe; In situ monitoring; Photoelectrochemical microscopy (PEM)

Indexed keywords

ELECTRODEPOSITION; FILM GROWTH; FILMS; IONS; MERCURY (METAL); MONITORING; OPTICAL MICROSCOPY;

CADMIUM TELLURIDE; IN SITU MONITORING; LASER SCANNING PHOTOELECTROCHEMICAL MICROSCOPY;

TELLURIUM COMPOUNDS;

EID: 0030121602     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-0728(95)04438-8     Document Type: Article

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