Structural investigation of metallic superlattices using X-ray anomalous scattering

Journal of Magnetism and Magnetic Materials

Volumn 156, Issue 1-3, 1996, Pages 111-113

  Barbara, A ^a   Tonnerre, J M ^a   Saint Lager, M C ^a   Raoux, D ^a   Andrieu, S ^a   Piecuch, M ^a   Elkaim, E ^a   Lauriat, J P ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; CRYSTAL STRUCTURE; ELECTROMAGNETIC WAVE ABSORPTION; ELECTROMAGNETIC WAVE SCATTERING; FILM PREPARATION; MAGNETIC PROPERTIES; METALLIC SUPERLATTICES; MOLECULAR BEAM EPITAXY; MULTILAYERS; X RAY CRYSTALLOGRAPHY;

ABSORPTION EDGES; IRON IRIDIUM SUPERLATTICES; SELECTIVE CHARACTERIZATION; SUBLATTICE; SYMMETRIC REFLECTION; X RAY ANOMALOUS SCATTERING;

MAGNETIC THIN FILMS;

EID: 0030120999     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(95)00807-1     Document Type: Article

References (8)

1. D.I.C. Pearson J. Phys. F 9 1979 1797
2. J. Kubler Solid State Commun. 72 1989 631
3. E.E. Fullerton Phys. Rev. B 45 1992 9292
4. J.M. Gallego Phys. Rev. B 51 1995 2550
5. M. De Santis Phys. Rev. B 46 1992 15465
6. S. Andrieu J. Magn. Magn. Mater. 121 1993 30
7. S. Andrieu Europhys. Lett. 26 1994 189
8. M.C. Saint-Lager Phys. Rev. B 51 1995