Structural characterization of thin films and multilayer structures

Journal De Physique. IV : JP

Volumn 6, Issue 3, 1996, Pages 265-270

  Temst, K ^a   Van Bael, M J ^a   Baert, M ^a   Rosseel, E ^a   Bruyndoncx, V ^a   Strunk, C ^a   Verbanck, G ^a   Mae, K ^a   Van Haesendonck, C ^a   Moshchalkov, V V ^a   Bruynseraede, Y ^a   Jonckheere, R ^b   De Groot, D G ^c   Koeman, N ^c   Griessen, R ^c  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b IMEC   (Belgium)

^c VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAIN SIZE AND SHAPE; MOLECULAR BEAM EPITAXY; MULTILAYERS; SUBSTRATES; SURFACE ROUGHNESS; SURFACE STRUCTURE; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

IMAGE MESOSCOPIC LINES; IMAGE MESOSCOPIC RINGS; SHIELDING CURRENTS; SUBMICROMETER SIZED HOLES; SUPERCONDUCTING ALUMINUM LOOPS;

SUPERCONDUCTING FILMS;

EID: 0030120597     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)

1. Moshchalkov V.V., Gielen L., Dhallé M., Van Haesendonck C., and Bruynseraede Y., Nature 361 (1993) 617
2. Baert M., Metlushko V.V., Jonckheere R., Moshchalkov V.V., and Bruynseraede Y., Phys. Rev. Lett. 74 (1995) 3269
3. Fullerton E., Schuller I.K., Vanderstraeten H., and Bruynseraede Y., Phys. Rev. B 45 (1992) 9292
4. Neerinck D., Vanderstraeten H., Stockman L., Locquet J.-P., Bruynseraede Y., and Schuller I.K., J. Phys.: Condens. Matter 2 (1990) 4111
5. Shen Q., Umbach C.C., Weselak B., and Blakely J.M., Phys. Rev. B 48 (1993) 17967
6. Temst K., Van Bael M.J., Wuyts B., Van Haesendonck C., Bruynseraede Y., de Groot D.G., Koeman N., and Griessen R., Appl. Phys. Lett. 67 (1995) 3429
7. Fullerton E.E., Pearson J., Sowers C.H., Bader S.D., Wu X.Z., and Sinha S.K., Phys. Rev. B 48 (1993) 17432