A new preparation method for cross-sectional TEM specimens

Materials Characterization

Volumn 36, Issue 4-5, 1996, Pages 365-369

  Klaar, Hans Jaochim ^a   Hsu, Fu Yung ^a  

^a RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BERYLLIUM COMPOUNDS; CASTING; CRUSHING; CURING; INTERFACES (MATERIALS); METAL PRESSING; TRANSMISSION ELECTRON MICROSCOPY;

CROSS SECTIONAL SPECIMENS; MECHANICAL THINNING; SILICON SHEETS;

SPECIMEN PREPARATION;

EID: 0030114265     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/s1044-5803(96)00039-3     Document Type: Article

References (2)

1. S. Kumar, G. L. Messing, and C. A. Randall, Preparation of unsupported metal organic and ceramic thin film specimens for TEM observation, J. Am. Ceram. Soc. 76:1882-1884 (1993).
2. A. Strecker, U. Salzberger, and J. Mayer, Specimen preparation for transmission elektronen mikroscopy: reliable method for cross-sections and brittle materials, Pract. Metall. 30:482-495 (1993).