Concentration and annealing effects on photoluminescence and local structure of Er-implanted silica

Journal of Non-Crystalline Solids

Volumn 195, Issue 3, 1996, Pages 232-238

  Marcus, Matthew ^a   Jacobson, Dale ^a   Vredenberg, Arjen ^b   Lamble, Geraldine ^c  

^a LUCENT TECHNOLOGIES   (United States)

^b UTRECHT UNIVERSITY   (Netherlands)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; EFFECTS; ERBIUM; GLASS; HIGH TEMPERATURE OPERATIONS; OPTICAL VARIABLES MEASUREMENT; PHOTOLUMINESCENCE; STRUCTURE (COMPOSITION); X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE; LOCAL STRUCTURE;

SILICA;

EID: 0030110564     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3093(95)00535-8     Document Type: Article

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