A superconducting X-ray spectrometer with a tantalum absorber and lateral trapping

IEEE Transactions on Applied Superconductivity

Volumn 6, Issue 1, 1996, Pages 1-4

  Gaidis, M C ^a   Friedrich, S ^a   Segall, K ^a   Prober, D E ^a   Szymkowiak, A E ^b   Moseley, S H ^b  

^a Yale University   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; ELECTRON ABSORPTION; ELECTRONS; ENERGY GAP; SUPERCONDUCTING DEVICES; SUPERCONDUCTING MATERIALS; SUPERCONDUCTING TRANSITION TEMPERATURE; TANTALUM; TUNNEL JUNCTIONS;

CHARGE COLLECTION; FULL WIDTH HALF MAXIMUM; HIGH EFFICIENCY X RAY DETECTION; HIGH ENERGY RESOLUTION; LATERAL TRAPPING; TANTALUM ABSORBER;

X RAY SPECTROMETERS;

EID: 0030110470     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.488272     Document Type: Article

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