Polychromatic X-ray method for residual-stress measurements in a subsurface layer

Experimental Mechanics

Volumn 36, Issue 1, 1996, Pages 24-32

  Shibano, J ^b   Tadano, S ^a,b   Ukai, T ^b  

^a SEM ^*

^b HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); COMPUTER SIMULATION; MATHEMATICAL MODELS; MEASUREMENT THEORY; NONDESTRUCTIVE EXAMINATION; STEEL; STRAIN; STRESS CONCENTRATION; SURFACE TREATMENT; X RAY CRYSTALLOGRAPHY; X RAYS;

DIFFRACTED BEAM PROFILE; INTERPLANAR SPACING; PLATE BENDING THEORY; POLYCHROMATIC XRAY METHOD; RESIDUAL STRESS MEASUREMENT; STRAIN DISTRIBUTION PATTERNS; STRESS GRADIENT;

RESIDUAL STRESSES;

EID: 0030110379     PISSN: 00144851     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02328694     Document Type: Article

References (12)

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