Surface periodic structures induced by pulsed laser irradiation of fullerite

Applied Physics Letters

Volumn 68, Issue 13, 1996, Pages 1769-1771

  Milani, P ^a   Manfredini, M ^a  

^a UNIVERSITY OF MILAN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; FULLERENES; INFRARED RADIATION; LASER BEAM EFFECTS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PULSED LASER APPLICATIONS; SCANNING ELECTRON MICROSCOPY; THERMAL EFFECTS; ULTRAVIOLET RADIATION;

ELECTRONIC EFFECTS; FULLERITE; INCIDENCE ANGLE; LASER FLUENCE; PERIODIC STRUCTURES; PULSED LASER IRRADIATION; RIPPLES; WAVELENGTH;

SURFACE STRUCTURE;

EID: 0030109799     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116661     Document Type: Article

References (22)

1. For a review, see Laser Ablation, Springer Series in Materials Science, edited by J. C. Miller (Springer, Heidelberg, 1994), Vol. 28.
2. H. M. van Driel, J. E. Sipe, and J. Young, Phys. Rev. Lett. 49, 1955 (1982);
3. J. Young, J. S. Preston, H. M. van Driel, and J. E. Sipe, Phys. Rev. B 27, 1155 (1983).
4. R. Srinivasan and V. Mayne-Banton, Appl. Phys. Lett. 41, 576 (1982).
5. H. Niino, M. Nakano, S. Nagano, A. Yabe, and T. Miki, Appl. Phys. Lett. 55, 510 (1989).
6. P. E. Dyer, S. D. Jenkins, and J. Sidhu, Appl. Phys. Lett. 49, 453 (1986).
7. C. Yeretzian, K. Hansen, F. Diederich, and R. L. Whetten, Nature 359, 44 (1992).
8. S. W. McElvany, J. H. Callahan, M. M. Ross, L. D. Lamb, and D. R. Huffman, Science 260, 1632 (1993).
9. M. Manfredini, C. E. Bottani, and P. Milani, Chem. Phys. Lett. 226, 600 (1994).
10. M. Manfredini and P. Milani, Appl. Phys. Lett. 66, 153 (1995);
11. S. Serra, M. Manfredini, P. Milani, and L. Colombo, Chem. Phys. Lett. 238, 281 (1995).
12. E. E. B. Campbell, I. V. Hertel, Ch. Kusch, R. Mintzer, and B. Winter, Synth. Met. (in press).
13. P. Milani, M. Manfredini, and C. E. Bottani, Synth. Met. (in press).
14. M. Patrini, F. Marabelli, G. Guizetti, M. Manfredini, C. Castoldi, and P. Milani, in Recent Advances in the Chemistry and Physics of Fullerene and Related Materials, edited by K. M. Kadish and R. S. Ruoff (The Electro-chemical Society, Pennington, NJ, 1994).
15. A. F. Hebard, O. Zhou, Q. Zhong, R. M. Fleming, and R. C. Haddon, Thin Solid Films 257, 147 (1995), and references therein.
16. A systematically higher damage threshold is observed for high quality surface samples (single crystals).
17. H. J. Byrne, W. K. Maser, M. Kaiser, W. W. Ruehle, L. Akselrod, A. T. Werner, J. Anders, X.-Q. Zhou, G. Mahler, T. Kuhn, A. Mittelbach, and S. Roth, Appl. Phys. A 57, 303 (1993).
18. S. R. Flom, R. G. S. Pong, F. J. Bartoli, and Z. H. Kafafi, Phys. Rev. B 46, 15598 (1992).
19. D. Jost, H. P. Weber, and G. Benedek, J. Electron Spectrosc. Relat. Phenom. 44, 345 (1987).
20. J. Kanasaki, A. Okamo, K. Ishikawa, Y. Nakai, and N. Itoh, Phys. Rev. Lett. 70, 2495 (1993);
21. K. Hattori, A. Okano, Y. Nakai, N. Itoh, and R. F. Haglund, Jr., J. Phys. Condens. Matter 3, 7001 (1991).
22. P. Milani, M. Manfredini, G. Guizzetti, F. Marabelli, and M. Patrini, Solid State Commun. 90, 639 (1994).