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Microelectronics Reliability
Volumn 36, Issue 3, 1996, Pages 385-388
Availability of K-out-of-N: G systems with M failure modes
Author keywords

[No Author keywords available]
Indexed keywords

AVAILABILITY; CALCULATIONS; FAILURE ANALYSIS; MARKOV PROCESSES; MATHEMATICAL MODELS; PROBABILITY; REDUNDANCY; SYSTEM THEORY;
EID: 0030109679     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/0026-2714(95)00062-3     Document Type: Article
Times cited : (16)
References (6)
  • 2
    • 0026142478 scopus 로고
    • Redundancy optimization of k-out-out-n systems with common-cause failures
    • D. S. Bai, W. Y. Yun and X. W. Chung, Redundancy optimization of k-out-out-n systems with common-cause failures, IEEE Trans. Reliab. 40, 56-59 (1991).
    • (1991) IEEE Trans. Reliab. , vol.40 , pp. 56-59
    • Bai, D.S.1    Yun, W.Y.2    Chung, X.W.3
  • 3
    • 0026838053 scopus 로고
    • Availability of systems with partially observable failures
    • O. C. Ibe and A. S. Wein, Availability of systems with partially observable failures, IEEE Trans. Reliab. 41, 92-96 (1992).
    • (1992) IEEE Trans. Reliab. , vol.41 , pp. 92-96
    • Ibe, O.C.1    Wein, A.S.2
  • 4
    • 0026385163 scopus 로고
    • Optimal designs of {k, n - K + 1}-out-of-n:F systems (subject to 2 failure modes)
    • H. Pham and M. Pham, Optimal designs of {k, n - k + 1}-out-of-n:F systems (subject to 2 failure modes), IEEE Trans. Reliab. 40, 559-562 (1991).
    • (1991) IEEE Trans. Reliab. , vol.40 , pp. 559-562
    • Pham, H.1    Pham, M.2
  • 6
    • 0028387616 scopus 로고
    • Reliability of k-out-of-n: G system with imperfect fault-coverage
    • S. Akhtar, Reliability of k-out-of-n: G system with imperfect fault-coverage, IEEE Trans. Reliab. 43, 101-106 (1994).
    • (1994) IEEE Trans. Reliab. , vol.43 , pp. 101-106
    • Akhtar, S.1

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.