Hot Wall epitaxy of C60 thin films on mica and their characterization

Fullerene Science and Technology

Volumn 4, Issue 2, 1996, Pages 277-295

  Stifter, D ^a   Sitter, H ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRACKS; DIGITAL SIGNAL PROCESSING; EPITAXIAL GROWTH; MICA; PHOTOLUMINESCENCE; SUBSTRATES; SURFACES; THIN FILMS; X RAY CRYSTALLOGRAPHY;

FULL WIDTH AT HALF MAXIMUM; HOT WALL EPITAXY;

FULLERENES;

EID: 0030109109     PISSN: 1064122X     EISSN: None     Source Type: Journal    
DOI: 10.1080/10641229608001551     Document Type: Article

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