Parameter estimation in markov random field contextual models using geometric models of objects

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 18, Issue 3, 1996, Pages 326-329

  Nadabar, Sateesha G ^a   Jain, Anil K ^b  

^a Innovision Corporation   (United States)

^b Michigan State University   (United States)

Author keywords

CAD models; Clique potentials; Edge detection; Line process; Markov random fields; Parameter estimation; Range mage

Indexed keywords

COMPUTER AIDED DESIGN; EDGE DETECTION; MARKOV PROCESSES; MATHEMATICAL MODELS; PARAMETER ESTIMATION;

CLIQUE POTENTIALS; LINE PROCESS; MARKOV RANDOM FIELDS; RANGE IMAGE;

OBJECT RECOGNITION;

EID: 0030109041     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.485560     Document Type: Article

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