Computer color mapping analyses of deformation bands and recrystallized grains inside elongated grains near surface of hot-rolled silicon steel sheet

Materials Transactions, JIM

Volumn 37, Issue 3, 1996, Pages 203-209

  Inokuti, Yukio ^a   Saito, Fumio ^a   Gotoh, Chizuko ^a  

^a JFE STEEL CORPORATION   (Japan)

Author keywords

Computer color mapping; Deformation band; Elongated grain; Grain boundary; Hot rolled steel; Image analysis; Kassel technique; Silicon steel

Indexed keywords

COMPUTER APPLICATIONS; CRYSTAL ORIENTATION; DEFORMATION; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; HOT ROLLING; IMAGE ANALYSIS; MORPHOLOGY; RECRYSTALLIZATION (METALLURGY); SILICON STEEL; STRAIN;

COMPUTER COLOR MAPPING; DEFORMATION BAND; ELONGATED GRAINS; KOSSEL PATTERN EXAMINATION TECHNIQUE;

STEEL SHEET;

EID: 0030108601     PISSN: 09161821     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans1989.37.203     Document Type: Article

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