Application of diode lasers as a spectroscopic tool at 670 nm

Optics Communications

Volumn 124, Issue 3-4, 1996, Pages 283-286

  Hof, T ^a   Fick, D ^a   Jansch H J ^a  

^a PHILIPPS UNIVERSITY MARBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIREFLECTION COATINGS; ATOMIC BEAMS; ATOMIC SPECTROSCOPY; DIFFRACTION GRATINGS; FEEDBACK; FLUORESCENCE; LASER OPTICS; LASER TUNING; LITHIUM; NATURAL FREQUENCIES; OPTICAL INSTRUMENT LENSES;

COLLIMATING LENS; LINEWIDTH; LITHIUM ATOMIC BEAM; LITTROW GEOMETRY;

SEMICONDUCTOR LASERS;

EID: 0030108238     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(95)00698-2     Document Type: Article

References (8)

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6. M. de Labachelerie and G. Passedat, Appl. Optics 32 (1993) 269.
7. K.B. MacAdam, A. Steinbach and C. Wieman, Am. J. Phys. 60 (12) (1992) 1098.
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