Study of photocathode protection with thin dielectric films

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 371, Issue 1-2, 1996, Pages 147-150

  Buzulutskov, A ^a   Breskin, A ^a   Chechik, R ^a   Va'vra, J ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ALUMINUM; CESIUM COMPOUNDS; COPPER COMPOUNDS; DIELECTRIC FILMS; ELECTRON TRANSPORT PROPERTIES; FLUORINE COMPOUNDS; OXIDES; PROTECTIVE COATINGS; STABILITY; THIN FILMS; WATER;

CESIUM IODIDE; COPPER IODIDE; ELECTRON AFFINITY; ELECTRON ESCAPE LENGTH;

PHOTOCATHODES;

EID: 0030107944     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(95)01148-X     Document Type: Article

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