Role of underlayers in the development of evolutionary texture in polycrystalline thin films

Surface and Coatings Technology

Volumn 80, Issue 1-2, 1996, Pages 109-112

  Adamik, M ^a   Barna, P B ^a  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

Impurities; Texture; Thin films; Underlayer

Indexed keywords

ALUMINA; ALUMINUM; AMORPHOUS MATERIALS; CHROMIUM; GRAIN BOUNDARIES; IMPURITIES; INTERFACIAL ENERGY; POLYCRYSTALLINE MATERIALS; TEMPERATURE; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; TRANSPORT PROPERTIES;

GRAIN BOUNDARY MIGRATION; IMPURITY CONTENT; POLYCRYSTALLINE THIN FILMS; UNDERLAYERS;

THIN FILMS;

EID: 0030107461     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/0257-8972(95)02695-9     Document Type: Article

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