Accurate de-embedding technique for on-chip small-signal characterization of high-frequency optical modulator

IEEE Photonics Technology Letters

Volumn 8, Issue 3, 1996, Pages 402-404

  Loi, K K ^a   Sakamoto, I ^a,b   Shao, X F ^a,c   Hou, H Q ^a,d   Liao, H H ^a   Mei, X B ^a   Cheng, A N ^a,e   Tu, C W ^a   Chang, W S C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b MITSUBISHI CHEMICAL CORPORATION   (Japan)

^c Deacon Research   (United States)

^d SANDIA NATIONAL LABORATORIES   (United States)

^e HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORK ANALYZERS; EQUIVALENT CIRCUITS; ERROR CORRECTION; MATHEMATICAL TECHNIQUES; MICROWAVE CIRCUITS; MICROWAVE MEASUREMENT; OPTICAL WAVEGUIDES; SEMICONDUCTOR QUANTUM WELLS;

DE EMBEDDING TECHNIQUE; HIGH FREQUENCY OPTICAL MODULATORS; ON CHIP SMALL SIGNAL CHARACTERIZATION;

LIGHT MODULATORS;

EID: 0030107352     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.481131     Document Type: Article

References (5)

1. D. D. Hall, M. J. Wale, C. Edge, and N. J. Parsons, "Advances in microwave optoelectronics," GEC J. Res., vol. 10, no. 2, pp. 80-84, 1993.
2. R. W. Wong, P. Hernday, M. G. Hart, and G. A. Conrad, "High-speed lightwave component analysis," Hewlett-Packard J., pp. 35-51, June 1989.
3. D. Kaiser, H. Großkopf, F. Grotjahn, I. Gyuro, W. Kuebart, J.-H. Reemtsma, and H. Eisele, "De-embedding of on-wafer lightwave measurements performed on a monolithic 10 Gb/s InP receiver-oeic," in Proc. 23rd Europ. Microwave Conf., Madrid, Spain, 1993, pp. 361-363.
4. P. Debie, L. Martens, and D. Kaiser, "Improved error correction technique for on-wafer lightwave measurements of photodetectors," IEEE Photon. Technol. Lett., vol. 7, no. 4, pp. 418-420, 1995.
5. S. Lautzenhiser, "Improved accuracy of on-wafer tests via LRM calibration," Microwaves & RF, pp. 105-109, Jan. 1990.