Cross-sectional transmission electron microscopy and scanning tunnelling microscopy applied to investigation of phase segregation in III-V multilayers grown by molecular beam epitaxy

Philosophical Magazine Letters

Volumn 73, Issue 3, 1996, Pages 129-136

  McComb, D W ^a,c   Okada, T ^a   Weatherly, G C ^a   Wolkow, R A ^b   Hulse, J E ^b  

^a MCMASTER UNIVERSITY   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^c UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYS; CRYSTAL LATTICES; ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; MULTILAYERS; PHASE SEPARATION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SUBSTRATES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

CONTRAST FLUCTUATIONS; CONTRAST VARIATION; PHASE SEGREGATION; STRAIN INDUCED DISTORTION; WAVELENGTH;

SEMICONDUCTOR GROWTH;

EID: 0030107078     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008396180939     Document Type: Article

References (7)

1. Albrektsen, O., Arent, D. J., Meier, H. P., and Salemink, H. W. M., 1990, Appl. Phys. Lett., 57, 31.
2. Carstensen, J., Claessen, R., Manzke, R., and Skibowski, M., 1990, Phys. Rev. B, 41, 9880.
3. Feenstra, R. M., 1994, Phys. Rev. B, 50, 4561.
4. Feenstra, R. M., and Stroscio, J. A., 1993, Scanning Tunneling Microscopy, Methods of Experimental Physics, Vol. 27, edited by J. A. Stroscio and W. J. Kaiser (San Diego, California: Academic Press), chap. 5.3.
5. Kuphal, E., 1984, J. Cryst. Growth, 67, 441.
6. Lapierre, R. R., Okada, T., Robinson, B. J., Thompson, D. A., and Weatherly, G. C., 1995, J. Cryst. Growth, 155, 1.
7. Treacy, M. M. J., Gibson, J. M., and Howie, A., 1985, Phil. Mag. A, 51, 389.