Application of phase-sensitive photoreflectance spectroscopy to a study of undoped AlGaAs/GaAs quantum well structures

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 632-637

  Hughes, P J ^a   Weiss, B L ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CHARACTERIZATION; ELECTRIC FIELDS; ETCHING; LIGHT MODULATION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM WELLS; SPECTROSCOPIC ANALYSIS;

PHASE DETECTION ANGLE DEPENDENCE; PHASE SENSITIVE PHOTOREFLECTANCE SPECTROSCOPY; PHOTOCARRIERS; SINGLE QUANTUM WELL STRUCTURE; SPECTRAL ENERGY;

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 0030106626     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589148     Document Type: Article

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