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Volumn 29, Issue 3, 1996, Pages 934-938
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Application of DLTS to silicon solar cell processing
a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
CHARGE CARRIERS;
CRYSTAL GROWTH FROM MELT;
DEGRADATION;
PROCESSING;
SILICON WAFERS;
SINGLE CRYSTALS;
SOLAR CELLS;
FLOAT ZONE;
MINORITY CARRIER LIFETIME DEGRADATION;
SILICON SOLAR CELL;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
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EID: 0030106591
PISSN: 00223727
EISSN: None
Source Type: Journal
DOI: 10.1088/0022-3727/29/3/063 Document Type: Article |
Times cited : (12)
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References (7)
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