Tuning of mid-infrared diode lasers for spectroscopy operated in sub-μs-pulses

IEEE Journal of Quantum Electronics

Volumn 32, Issue 3, 1996, Pages 456-462

  Kastner, Joachim F ^a,c,d   Tacke, Maurus ^{a,b,c,e,f,g,h}  

^a FRAUNHOFER INSTITUTE FOR PHYSICAL MEASUREMENT TECHNIQUES IPM   (Germany)

^b IEEE

^c UNIVERSITY OF WÜRZBURG   (Germany)

^d UNIVERSITY OF NEW MEXICO   (United States)

^e UNIVERSITY OF FREIBURG   (Germany)

^f UNIVERSITY OF STUTTGART   (Germany)

^g IBM   (United States)

^h Department of Optical Spectroscopy ^*

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DETECTORS; GAS ABSORPTION; LIGHT EMISSION; LIGHT EMITTING DIODES; MATHEMATICAL MODELS; PULSED LASER APPLICATIONS; SEMICONDUCTING LEAD COMPOUNDS; SPECTROSCOPY;

HIGH RESOLUTION LASER SPECTROSCOPY; INJECTION CURRENT; LEAD CHALCOGENIDE DIODE LASERS; LEAD SALT DIODE LASERS; PELTIER COOLER TEMPERATURE; SPECTRAL RADIATION CHARACTERISTICS;

SEMICONDUCTOR LASERS;

EID: 0030106415     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.485397     Document Type: Article

References (2)

1. U. Lambrecht, "Abstimmung und Linienbreite von Diodenlasern in der Infrarotspektroskopie," Diploma thesis, Freiburg, 1991.
2. H. Meixner, "Optical method for determination of the thermal resistivity of laser diodes," Siemens Research and Development Rep., vol. 3, no. 3, pp. 190-194, 1974.