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Volumn 12, Issue 2, 1996, Pages 101-112

Application of generalized linear models to the design improvement of an engineering artefact

Author keywords

Design of experiments; Generalized linear models; Non parametric model fitting; Redesign and design improvement; Response surface methodology

Indexed keywords

CURVE FITTING; ERRORS; FIBER OPTICS; MATHEMATICAL MODELS; OPTIMIZATION; REGRESSION ANALYSIS;

EID: 0030106232     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1638(199603)12:2<101::AID-QRE991>3.0.CO;2-9     Document Type: Article
Times cited : (16)

References (12)
  • 1
    • 0023964171 scopus 로고
    • Application of statistical design and response surface methods to computer-aided VLSI device design
    • A. R. Alvarez, B. L. Abdi, D. L. Young, H. D. Weed, J. Teplik and E. R. Herald, 'Application of statistical design and response surface methods to computer-aided VLSI device design', IEEE Trans. Computer-Aided Design, 7, (2), 272-288 (1988).
    • (1988) IEEE Trans. Computer-Aided Design , vol.7 , Issue.2 , pp. 272-288
    • Alvarez, A.R.1    Abdi, B.L.2    Young, D.L.3    Weed, H.D.4    Teplik, J.5    Herald, E.R.6
  • 2
    • 0025894596 scopus 로고
    • Application of statistical design and response surface methods to computer-aided VLSI device design II: Desirability functions and Taguchi methods
    • D. L. Young, J. Teplik, H. D Weed, N. T. Tracht and A. R. Alvarez, 'Application of statistical design and response surface methods to computer-aided VLSI device design II: desirability functions and Taguchi methods', IEEE Trans. on Computer-Aided Design, 10, (1), 103-115 (1991).
    • (1991) IEEE Trans. on Computer-Aided Design , vol.10 , Issue.1 , pp. 103-115
    • Young, D.L.1    Teplik, J.2    Weed, H.D.3    Tracht, N.T.4    Alvarez, A.R.5
  • 4
    • 0027242802 scopus 로고
    • Yield optimization of Analog MOS integrated circuits including transistor mismatch
    • IEEE
    • H. Su, C. Michael and M. Ismail, 'Yield optimization of Analog MOS integrated circuits including transistor mismatch', Proc. ISCAS, IEEE, 1993, pp. 1801-1804.
    • (1993) Proc. ISCAS , pp. 1801-1804
    • Su, H.1    Michael, C.2    Ismail, M.3
  • 10
    • 0000456152 scopus 로고
    • An extended quasi-likelihood function
    • J. A. Neider and D. Pregibon, 'An extended quasi-likelihood function', Biometrika, No. 74, 1987, pp. 221-232.
    • (1987) Biometrika , vol.74 , pp. 221-232
    • Neider, J.A.1    Pregibon, D.2
  • 11
    • 85033835885 scopus 로고
    • Response surface approximation methods for Philips lighting
    • Center for Manufacturing, Philips, The Netherlands
    • P. Wolbert, 'Response surface approximation methods for Philips lighting', Philips Internal Report, CTB598-94-1017, Center for Manufacturing, Philips, The Netherlands, 1994.
    • (1994) Philips Internal Report, CTB598-94-1017
    • Wolbert, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.