An image processing system for track-etch detectors

Radiation Measurements

Volumn 26, Issue 2, 1996, Pages 187-191

  Kokkas, P ^a   Kokkinidis, P ^a   Pavlopoulos, P ^a   Vlachos, S ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; IMAGE PROCESSING; PATTERN RECOGNITION SYSTEMS;

SOLID STATE NUCLEAR TRACK DETECTORS; TRACK ETCH DETECTORS;

PARTICLE DETECTORS;

EID: 0030105514     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/1350-4487(95)00306-1     Document Type: Article

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