Refractivities of SF6 and SOF2 at wavelengths of 632.99 and 1300 nm

Journal of Physics D: Applied Physics

Volumn 29, Issue 3, 1996, Pages 634-637

  Vukovic, D ^a   Woolsey, G A ^a   Scelsi, G B ^a  

^a UNIVERSITY OF NEW ENGLAND   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

SULFUR HEXAFLUORIDE; THIONYL FLUORIDE;

DEGRADATION; DISSOCIATION; ELECTRIC DISCHARGES; INTERFEROMETERS; INTERFEROMETRY; LIGHT POLARIZATION; OPTICAL VARIABLES MEASUREMENT; SULFUR COMPOUNDS;

REFRACTIVE INDEX;

EID: 0030105092     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/29/3/023     Document Type: Article

References (12)

1. Buckingham A D and Graham C 1974 Proc. R. Soc. A 337 275-91
2. Clegg H P, Rowlinson J S and Sutton I R 1955 Trans. Faraday Soc. 51 1327-33
3. Hamann S D, McManamey W J and Pearse J F 1953 Trans. Faraday Soc. 49 351-7
4. Lee P H and Woolsey G A 1981 Appl. Opt. 20 3514-19
5. MacCormack K E and Schneider W G 1951 J. Chem. Phys. 19 845-9
6. St-Arnaud J M and Bose T K 1979 J Chem. Phys. 71 4951-5
7. Schumb W C 1947 Indust. Eng. Chem. 39 421-3
8. Thomas M E and Tayag T J 1988 Appl. Opt. 27 3317-31
9. Watson H E and Ramaswamy K L 1936 Proc. R. Soc. A 156 144-57
10. Woolsey G A, Ijumba N M and Parish O 1986 J. Phys. D: Appl. Phys. 19 2135-2146
11. Woolsey G A and Grey D J 1989 Proc. XIX Int. Conf. on Phenomena in Ionized Gases (Belgrade) vol 3, ed J M Labat (Belgrade: University of Belgrade) pp 534-5
12. Van Brunt R J 1985 J. Res. NBS 90 229-53