Application of measurement models to electrohydrodynamic impedance spectroscopy

Journal of the Electrochemical Society

Volumn 143, Issue 3, 1996, Pages 948-960

  Orazem, Mark E ^a   Agarwal, Pankaj ^a,c   Deslouis, Claude ^b   Tribollet, Bernard ^b  

^a University of Florida   (United States)

^b Université Pierre et Marie Curie   (France)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROCHEMISTRY; MATHEMATICAL MODELS; PHYSICAL PROPERTIES; RANDOM PROCESSES; SIGNAL FILTERING AND PREDICTION; SPECTROSCOPY; SPURIOUS SIGNAL NOISE; SURFACE PHENOMENA;

ELECTROHYDRODYNAMIC IMPEDANCE SPECTROSCOPY; ERROR STRUCTURE; KRAMERS KRONIG RELATIONS; MEASUREMENT MODELS; SCHMIDT NUMBER;

ELECTRIC IMPEDANCE;

EID: 0030105089     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1836564     Document Type: Article

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