-
1
-
-
0003937505
-
-
SPIE Tutorial Texts; SPIE: Bellingham, WA, Chapter 1.
-
Dammel, R. Diazonaphthoquinone-based Resists; SPIE Tutorial Texts; SPIE: Bellingham, WA, 1993; Vol. 11, Chapter 1.
-
(1993)
Diazonaphthoquinone-based Resists
, vol.11
-
-
Dammel, R.1
-
2
-
-
85033826052
-
-
German Patent 879,205, 1949
-
Kalle A. G. German Patent 879,205, 1949.
-
-
-
Kalle, A.G.1
-
3
-
-
85033814160
-
-
Azoplate Corp. U.S. Patent 2,766,118, 1956
-
Azoplate Corp. U.S. Patent 2,766,118, 1956.
-
-
-
-
4
-
-
0026923068
-
-
Yeh, T. F.; Shih, H. Y.; Reiser, A. Macromolecules 1992, 25, 5345.
-
(1992)
Macromolecules
, vol.25
, pp. 5345
-
-
Yeh, T.F.1
Shih, H.Y.2
Reiser, A.3
-
6
-
-
0027627416
-
-
Yeh, T. F.; Reiser, A.; Dammel, R. R.; Pawlowski, G., Roeschert, H. Macromolecules 1993, 26, 3862.
-
(1993)
Macromolecules
, vol.26
, pp. 3862
-
-
Yeh, T.F.1
Reiser, A.2
Dammel, R.R.3
Pawlowski, G.4
Roeschert, H.5
-
7
-
-
0028766585
-
-
Shih, H. Y.; Yeh, T. F.; Reiser, A.; Dammel, R. R.; Merrem, H. J.; Pawlowski, G. Macromolecules 1994, 27, 3330.
-
(1994)
Macromolecules
, vol.27
, pp. 3330
-
-
Shih, H.Y.1
Yeh, T.F.2
Reiser, A.3
Dammel, R.R.4
Merrem, H.J.5
Pawlowski, G.6
-
9
-
-
60849136202
-
-
Honda, K.; Beauchemin, B. T., Jr.; Hurditch, R. J.; Blakeney, A.; Kawabe, Y.; Kokubo, T. Proc. SPIE 1990, 1262, 493.
-
(1990)
Proc. SPIE
, vol.1262
, pp. 493
-
-
Honda, K.1
Beauchemin Jr., B.T.2
Hurditch, R.J.3
Blakeney, A.4
Kawabe, Y.5
Kokubo, T.6
-
11
-
-
3342933763
-
-
Unpublished results
-
Yeh, T. F.; Reiser, A. Unpublished results, 1993.
-
(1993)
-
-
Yeh, T.F.1
Reiser, A.2
-
15
-
-
0000715762
-
-
Rosso, M.; Gouyet, J. F.; Sapoval, B. Phys. Rev. Lett. 1986, 57, 3195.
-
(1986)
Phys. Rev. Lett.
, vol.57
, pp. 3195
-
-
Rosso, M.1
Gouyet, J.F.2
Sapoval, B.3
-
16
-
-
0000886684
-
-
Yeh, T. F.; Shih, H. Y.; Reiser, A.; Toukhy, M. A.; Beauchemin, B. T. J. Vac. Sci. Technol. 1992, B10, 715.
-
(1992)
J. Vac. Sci. Technol.
, vol.B10
, pp. 715
-
-
Yeh, T.F.1
Shih, H.Y.2
Reiser, A.3
Toukhy, M.A.4
Beauchemin, B.T.5
-
18
-
-
85033810920
-
-
note
-
The number of phenolic units in the average cluster is crudely estimated from the dependence of log R on the concentration of inhibitors in the film. Up to concentrations of some 10% of inhibitor, log R is usually a linear function of inhibitor concentration. At higher values, deviations from linearity set in and these are thought to indicate interference between clusters.
-
-
-
-
20
-
-
0008311678
-
-
Suess, O. Annalen 1944, 556, 65; 1947, 557, 237.
-
(1944)
Annalen
, vol.556
, pp. 65
-
-
Suess, O.1
-
21
-
-
0008313768
-
-
Suess, O. Annalen 1944, 556, 65; 1947, 557, 237.
-
(1947)
Annalen
, vol.557
, pp. 237
-
-
-
23
-
-
84958485735
-
-
Erlikh, A. D.; Protsenko, N. P.; Kurovskaja, L. N.; Rodionova, G. N. Zh. Vses. Khim. Ova. 1975, 20, 593.
-
(1975)
Zh. Vses. Khim. Ova.
, vol.20
, pp. 593
-
-
Erlikh, A.D.1
Protsenko, N.P.2
Kurovskaja, L.N.3
Rodionova, G.N.4
-
25
-
-
3342905788
-
-
Thomson, L. F., Willson, C. G., Bowden, M. J., Eds.; ACS Symposium Series 219; American Chemical Society: Washington, UC
-
Willson, C. G. In Introduction to Microlithography; Thomson, L. F., Willson, C. G., Bowden, M. J., Eds.; ACS Symposium Series 219; American Chemical Society: Washington, UC, 1984; p 117.
-
(1984)
Introduction to Microlithography
, pp. 117
-
-
Willson, C.G.1
-
26
-
-
84917970653
-
-
Wolff, L. Liebigs Ann. Chem. 1902, 325, 129; 1912, 394, 23.
-
(1902)
Ann. Chem.
, vol.325
, pp. 129
-
-
Liebigs, W.L.1
-
27
-
-
84917970653
-
-
Wolff, L. Liebigs Ann. Chem. 1902, 325, 129; 1912, 394, 23.
-
(1912)
Ann. Chem.
, vol.394
, pp. 23
-
-
-
29
-
-
85033820778
-
-
Reference 26, p E-4
-
Reference 26, p E-4.
-
-
-
-
31
-
-
0022066737
-
-
Rodriguez, F.; Krasicky, P. D.; Groele, R. J. Solid State Technol. 1985, 28 (5), 125.
-
(1985)
Solid State Technol.
, vol.28
, Issue.5
, pp. 125
-
-
Rodriguez, F.1
Krasicky, P.D.2
Groele, R.J.3
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