Electronic energy loss at zero atomic impact parameter: Its importance for the Lewis effect and narrow nuclear resonance depth profiling

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 108, Issue 4, 1996, Pages 403-407

  Vickridge, I C ^a   Amsel, G ^b  

^a GNS SCIENCE   (New Zealand)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CALCULATIONS; CHARGED PARTICLES; ELECTRON ENERGY LOSS SPECTROSCOPY; IONIZATION; NEON; NUCLEAR MAGNETIC RESONANCE; NUCLEAR PHYSICS; NUMERICAL METHODS; RANDOM PROCESSES; RESONANCE;

ATOMIC IMPACT PARAMETER; DECONVOLUTION METHOD; ELECTRONIC ENERGY LOSS; EXCITATION CURVES; LEWIS EFFECT;

ATOMIC PHYSICS;

EID: 0030104848     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01163-3     Document Type: Article

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